X 射线荧光 (XRF)

X-ray Fluorescence (XRF) is a non-destructive analytical technique used to determine the elemental composition of materials by measuring the characteristic fluorescent X-rays emitted from a sample when it is excited by an X-ray source. This method is widely utilized in product design and quality control to ensure compliance with safety regulations and material specifications, particularly in industries such as electronics, manufacturing, and environmental analysis. By providing rapid and accurate elemental analysis, XRF facilitates innovation and informed decision-making throughout the research and production processes.