Tascon GmbH Germany failure analysis, ftir, leis, materials characterization, sem edx, surface analysis, tof-sims, and xps
Materia Nova Belgium failure analysis, ftir spectroscopy, materials characterization, raman spectroscopy, sem edx, surface analysis, tof-sims, and xps
nanoAnalytics GmbH Germany afm, failure analysis, rem-edx, sem, surface analysis, teer impedance, tof-sims, and xps
