Materia Nova

<p>Materia Nova provides advanced laboratory characterization and materials testing services utilizing high-end instrumentation:</p><ul><li><b>Electron Microscopy:</b> High-resolution Scanning Electron Microscopy (SEM) with Field Emission Gun (FEG), secondary and backscattered electron detectors, In-lens detector (1.3 nm resolution at 1 kV), Scanning Transmission Electron Microscopy detector (STEM), and Energy Dispersive X-ray spectrometry (EDX) for elemental composition mapping.</li><li><b>Sample Preparation:</b> Triple ion-beam polisher with liquid nitrogen cooling for cross-sectional preparation of delicate polymers, textiles, and composite interfaces.</li><li><b>Surface & Spectroscopic Analysis:</b> X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for surface chemistry and in-depth profile erosion, Fourier Transform Infrared Spectroscopy (FTIR), and Raman spectroscopy.</li><li><b>Diffraction & Elemental Analysis:</b> X-ray Diffraction (XRD), Inductively Coupled Plasma Mass Spectrometry (ICP-MS), and contact angle surface energy measurement.</li><li><b>Thermal & Mechanical Analysis:</b> Differential Scanning Calorimetry (DSC), Dynamic Mechanical Analysis (DMA), viscosimetry, tribology, and mechanical fatigue testing.</li><li><b>Failure Analysis & Corrosion Testing:</b> Root-cause identification of deposits, cracking, delamination, and corrosion; electrochemical impedance spectroscopy, salt spray testing, and climatic chambers.</li></ul>