Covalent Metrology, Inc.

United States

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Covalent Metrology, Inc. is an advanced materials testing and analytical services company based in Silicon Valley. The company provides analytical testing, characterization, and metrology consulting to innovators developing semiconductor, electronics, advanced manufacturing, and polymeric solutions.

Its primary laboratory houses over $20 million of modern analytical instruments integrated with RFID sample tracking and a cloud software platform.

Headquartered in Sunnyvale, California
Specialized failure analysis, physical testing, and chemical characterization workflows
Integrated metrology consulting services to augment client R&D teams

Offer

Covalent Metrology offers a broad portfolio of electron microscopy, chemical spectrometry, and mechanical characterization techniques:

Electron Microscopy: High-resolution Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Scanning Transmission Electron Microscopy (STEM), Focused Ion Beam SEM (FIB-SEM), and Electron Backscatter Diffraction (EBSD).
Chemical & Organic Analysis: Gas Chromatography-Mass Spectrometry (GC-MS), Inductively Coupled Plasma Mass Spectrometry (ICP-MS), Nuclear Magnetic Resonance Spectroscopy (NMR), Atomic Absorption Spectroscopy (AAS), and Dynamic Secondary Ion Mass Spectrometry (SIMS).
Spectroscopy & Surface Analysis: X-ray Photoelectron Spectroscopy (XPS / ESCA), Attenuated Total Reflectance Fourier Transform Infrared Spectroscopy (ATR-FTIR), Raman Spectroscopy, Auger Electron Spectroscopy (AES), UV-Vis-NIR Spectrophotometry, Spectroscopic Ellipsometry (SE), and Energy Dispersive X-ray Spectroscopy (EDS).
Structural & Thermal Testing: X-ray Diffraction (XRD), X-ray Computed Tomography (Micro-CT), Differential Scanning Calorimetry (DSC), Thermogravimetric Analysis (TGA), Dynamic Mechanical Analysis (DMA), and laser diffraction particle size analysis.
Consulting & Failure Analysis: Semiconductor and metallurgical root-cause failure analysis, 4-point probe electrical measurements, and surface wettability/contact angle analysis.

Covalent Metrology, Inc.

Offer

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