走査型電子顕微鏡（SEM）

Scanning Electron Microscopy (SEM) is a powerful imaging technique that utilizes focused beams of electrons to produce high-resolution, three-dimensional images of a sample’s surface morphology and composition. This method allows researchers and designers to analyze materials at the micro and nanoscale, providing critical insights into structural properties and potential areas for innovation. SEM is instrumental in product design and development, enabling precise quality control and optimization during the research and production phases.