X 射线衍射 (XRD)

X-ray Diffraction (XRD) is a powerful analytical technique used to determine the crystalline structure and phase composition of materials by measuring the angles and intensities of X-rays scattered by the sample. This method provides critical insights into the arrangement of atoms within a material, enabling researchers and designers to assess properties such as purity, crystallinity, and structural integrity. In product design and innovation, XRD facilitates the optimization of materials for enhanced performance and reliability in various applications.