Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) is a powerful imaging technique that utilizes focused beams of electrons to produce high-resolution, three-dimensional images of a sample’s surface morphology and composition. This 方法 allows researchers and designers to analyze materials at the micro and nanoscale, providing critical insights into structural properties and potential areas for 创新. SEM is instrumental in product design and development, enabling precise quality control and optimization during the research and production phases.